Atomic Force Microscopy of spermidine-induced DNA condensates on silicon surfaces

dc.contributor.authorCarrasco, I.S.S.
dc.contributor.authorBastos, F.M.
dc.contributor.authorMunford, M.L.
dc.contributor.authorRamos, E.B.
dc.contributor.authorRocha, M.S.
dc.date.accessioned2018-03-20T16:30:26Z
dc.date.available2018-03-20T16:30:26Z
dc.date.issued2011-09-21
dc.description.abstractIn the present work, we show that oxidized silicon may be successfully used to image multivalent cation-induced DNA condensates under the Atomic Force Microscope (AFM). The images thus obtained are good enough, allowing us to distinguish between different condensate forms and to perform nanometer-sized measurements. Qualitative results previously obtained using mica as a substrate are recovered here. We additionally show that the interactions between the cation spermidine (the condensing agent) and the DNA molecules are not significantly disturbed by the silicon surface, since the phase behavior of an ensemble of DNA molecules deposited on the silicon substrate as a function of the cation concentration is very similar to that found in solution.en
dc.formatpdfpt-BR
dc.identifier.issn09284931
dc.identifier.urihttps://doi.org/10.1016/j.msec.2011.09.008
dc.identifier.urihttp://www.locus.ufv.br/handle/123456789/18347
dc.language.isoengpt-BR
dc.publisherMaterials Science and Engineering: Cpt-BR
dc.relation.ispartofseriesv. 32, Issue 1, p. 36-39, January 2012pt-BR
dc.rightsElsevier B.V. All rights reserved.pt-BR
dc.subjectAtomic Force Microscopypt-BR
dc.subjectPolyelectrolytespt-BR
dc.subjectDNA condensationpt-BR
dc.titleAtomic Force Microscopy of spermidine-induced DNA condensates on silicon surfacesen
dc.typeArtigopt-BR

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